Device Stress Reduction
Device Stress Reduction is a methodological contribution in power electronics that, within the context of multilevel converters, refers to the strategic minimization of voltage and current stresses on semiconductor devices through optimized switching techniques, topological configurations, or control algorithms, thereby distinguishing it from general performance enhancement approaches by specifically targeting the alleviation of operational stresses that compromise device reliability and lifespan.
168
Publications
6.4K
Citations
676
Authors
203
Institutions
Publications per year
2017–2026
72
Parents
168
1–5 of 168
676
5
h-index
4
h-index
4
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3
h-index
1–5 of 676
203
University of Tabriz
Tabriz, Iran
7 h-index
21 publications
892 citations

Southeast University
Nanjing, China
5 h-index
15 publications
503 citations
Texas Instruments (United States)
Dallas, United States
5 h-index
13 publications
306 citations

Indian Institute of Science Bangalore
Bengaluru, India
5 h-index
10 publications
172 citations
Aalborg University
Aalborg, Denmark
4 h-index
9 publications
323 citations
Korea Advanced Institute of Science and Technology
Daejeon, South Korea
4 h-index
9 publications
240 citations
Toshiba (Japan)
Tokyo, Japan
3 h-index
30 publications
376 citations
Virginia Tech
Blacksburg, United States
3 h-index
7 publications
457 citations
1–8 of 203
19 publications · 1.4K citations
18
h-index
12 publications · 675 citations
10
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10 publications · 635 citations
9
h-index
PEL · 4 publications · 219 citations
4
h-index
4 publications · 173 citations
4
h-index
1–5