Device Stress Reduction

Device Stress Reduction is a methodological contribution in power electronics that, within the context of multilevel converters, refers to the strategic minimization of voltage and current stresses on semiconductor devices through optimized switching techniques, topological configurations, or control algorithms, thereby distinguishing it from general performance enhancement approaches by specifically targeting the alleviation of operational stresses that compromise device reliability and lifespan.

168

Publications

6.4K

Citations

676

Authors

203

Institutions

Publications per year

2017–2026

72

Authors

676

  1. EB
    Ebrahim Babaei

    University of Tabriz, Iran

    5 publications · 215 citations

    5

    h-index

  2. TJ
    Tohid Jalilzadeh

    University of Tabriz, Iran

    4 publications · 150 citations

    4

    h-index

  3. FB
    Frede Blaabjerg

    Aalborg University, Denmark

    4 publications · 154 citations

    4

    h-index

  4. HK
    Haruichi Kanaya

    Kyushu University, Japan

    3 publications · 56 citations

    3

    h-index

  5. MC
    Minjie Chen

    Princeton University, United States

    3 publications · 59 citations

    3

    h-index

1–5 of 676

Venues

  1. IEEE Transactions on Power Electronics

    19 publications · 1.4K citations

    18

    h-index

  2. IEEE Transactions on Industrial Electronics

    12 publications · 675 citations

    10

    h-index

  3. IEEE Transactions on Industry Applications

    10 publications · 635 citations

    9

    h-index

  4. IET Power Electronics

    PEL · 4 publications · 219 citations

    4

    h-index

  5. IEEE Electron Device Letters

    4 publications · 173 citations

    4

    h-index

1–5