The effects of gate length variation and trapping effects on the transient response of AlGaN/GaN HEMT’s on SiC substrates

M. Gassoumi, Mohamed Mongi Ben Salem, S. Saadaoui, B. Grimbert, Jol Fontaine, Christophe Gaquière, H. Mâaref

Microelectronic Engineering · 2010 · 27 citations · 16 references

Concepts

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