AEU - International Journal of Electronics and Communications · 2018 · 36 citations · 43 references
EngineeringComputer EngineeringElectrical EngineeringElectronic MaterialsMicroelectronicsSemiconductor DevicesDevice CharacterizationDevice ModelingDevice SimulationField-effect TransistorsMetal-oxide-semiconductor Field-effect TransistorsShort-channel EffectsGate LeakageGate Leakage CurrentGate Oxide LeakageGate-induced Drain LeakageLeakage Current AnalysisLeakage Current ModelingLeakage Current Reduction
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Tunnel field-effect transistor without gate-drain overlap
Anne S. Verhulst, William G. Vandenberghe, Karen Maex et al. · Applied Physics Letters · 2007 · 432 citations · Full text