Benchmarking SOI and bulk FinFET alternatives for PLANAR CMOS scaling succession

FinFET performance advantage at 22nm: An AC perspective

Michael Guillorn, Josephine Chang, A. Bryant et al. · 2008 · 83 citations

Device Modeling, Electrical Engineering, Engineering +11

Highly manufacturable FinFETs with sub-10nm fin width and high aspect ratio fabricated with immersion lithography

M.J.H. van Dal, Nadine Collaert, G. Doornbos et al. · 2007 · 79 citations

Engineering, Integrated Circuits, Interconnect (Integrated Circuits) +18

Self-heating characterization for SOI MOSFET based on AC output conductance

Wei Jin, S.K.H. Fung, Weidong Liu et al. · 2003 · 62 citations

Device Modeling, Electrical Engineering, Engineering +14

Device Design and Optimization Considerations for Bulk FinFETs

C. R. Manoj, Meenakshi Nagpal, Dhanya Varghese et al. · IEEE Transactions on Electron Devices · 2008 · 61 citations

Electrical Engineering, Engineering, Advanced Packaging (Semiconductors) +14

Comprehensive analysis of variability sources of FinFET characteristics

Takashi Matsukawa, S. O’uchi, Kazuhiko Endo et al. · Symposium on VLSI Technology · 2006 · 46 citations

Device Modeling, Electrical Engineering, Engineering +11