Nadine Collaert

Analysis of the Parasitic S/D Resistance in Multiple-Gate FETs

Abhisek Dixit, Anil Kottantharayil, Nadine Collaert et al. · IEEE Transactions on Electron Devices · 2005 · 355 citations

Engineering, Electrical Engineering, Electronic Materials +16

Gate-induced quantum-confinement transition of a single dopant atom in a silicon FinFET

G. P. Lansbergen, Rajib Rahman, Cameron Wellard et al. · Nature Physics · 2008 · 314 citations

Engineering, Electrical Engineering, Physics +16

Transport Spectroscopy of a Single Dopant in a Gated Silicon Nanowire

H. Sellier, G. P. Lansbergen, J. Caro et al. · Physical Review Letters · 2006 · 264 citations · Full text

Natural Sciences, Materials Science, Physics +17

Vertical GAAFETs for the Ultimate CMOS Scaling

Dmitry Yakimets, Geert Eneman, P. Schuddinck et al. · IEEE Transactions on Electron Devices · 2015 · 196 citations

Engineering, Computer Engineering, Electrical Engineering +17

Disorder-controlled-kinetics model for negative bias temperature instability and its experimental verification

B. Kaczer, V. Arkbipov, R. Degraeve et al. · 2005 · 170 citations

Engineering, Electrical Engineering, Physics +17