Concepedia

Interface Trap Density Measurement

Interface Trap Density Measurement is a semiconductor characterization metric that quantifies the density of electronic trap states at the interface between a semiconductor and an insulating layer, typically through electrical techniques such as capacitance-voltage or conductance methods, to assess interface quality and its impact on device performance.

291

Publications

12.6K

Citations

1.1K

Authors

298

Institutions

Publications per year

2017–2026

49

Parents

Publications

291

Comparison of methods to quantify interface trap densities at dielectric/III-V semiconductor interfaces

Roman Engel‐Herbert, Yoontae Hwang, Susanne Stemmer · Journal of Applied Physics · 2010 · 413 citations · Full text

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On the Correct Extraction of Interface Trap Density of MOS Devices With High-Mobility Semiconductor Substrates

Koen Martens, Chi On Chui, Guy Brammertz et al. · IEEE Transactions on Electron Devices · 2008 · 363 citations

, , +17

Characterization of defects in Si and SiO2−Si using positrons

P. Asoka‐Kumar, K. G. Lynn, D. O. Welch · Journal of Applied Physics · 1994 · 332 citations

, , +17

Interface traps and <i>P</i> <i>b</i> centers in oxidized (100) silicon wafers

G. J. Gerardi, Edward H. Poindexter, P. J. Caplan et al. · Applied Physics Letters · 1986 · 321 citations

, , +17

Evidence of low interface trap density in GeO2∕Ge metal-oxide-semiconductor structures fabricated by thermal oxidation

Hiroshi Matsubara, Takashi Sasada, Mitsuru Takenaka et al. · Applied Physics Letters · 2008 · 318 citations

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1–5 of 291

Authors

1.1K

  1. ST
    Shinichi Takagi

    The University of Tokyo, Japan

    8 publications · 596 citations

    8

    h-index

  2. JS
    John S. Suehle

    National Institute of Standards and Technology, United States

    7 publications · 325 citations

    7

    h-index

  3. DM
    Daniel M. Fleetwood

    Vanderbilt University, United States

    6 publications · 346 citations

    6

    h-index

  4. GG
    G. Groeseneken

    IMEC, Belgium

    6 publications · 654 citations

    6

    h-index

  5. CS
    Chih‐Tang Sah

    University of Illinois Urbana-Champaign, United States

    5 publications · 276 citations

    5

    h-index

1–5 of 1.1K

Institutions

298

  1. IMEC

    Leuven, Belgium

    11 h-index

    63 publications

    4.5K citations

  2. National Institute of Advanced Industrial Science and Technology

    Tsukuba, Japan

    9 h-index

    34 publications

    1.1K citations

  3. University of Florida

    Gainesville, United States

    9 h-index

    32 publications

    2.1K citations

  4. United States Naval Research Laboratory

    Washington, United States

    9 h-index

    26 publications

    1.1K citations

  5. The University of Tokyo

    Tokyo, Japan

    9 h-index

    26 publications

    2.1K citations

  6. Purdue University West Lafayette

    West Lafayette, United States

    8 h-index

    32 publications

    1K citations

  7. Stanford University

    Stanford, United States

    8 h-index

    26 publications

    3.8K citations

  8. National University of Singapore

    Singapore, Singapore

    8 h-index

    22 publications

    706 citations

1–8 of 298

Venues

  1. Applied Physics Letters

    52 publications · 2.7K citations

    26

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  2. Journal of Applied Physics

    37 publications · 2.4K citations

    22

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  3. IEEE Transactions on Electron Devices

    29 publications · 1.7K citations

    20

    h-index

  4. IEEE Electron Device Letters

    32 publications · 998 citations

    19

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  5. IEEE Transactions on Nuclear Science

    13 publications · 516 citations

    13

    h-index

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