Koen Martens

On the Correct Extraction of Interface Trap Density of MOS Devices With High-Mobility Semiconductor Substrates

Koen Martens, Chi On Chui, Guy Brammertz et al. · IEEE Transactions on Electron Devices · 2008 · 363 citations

Engineering, Electrical Engineering, Materials Science +17

Capacitance-voltage characterization of GaAs–Al2O3 interfaces

Guy Brammertz, H. C. Lin, Koen Martens et al. · Applied Physics Letters · 2008 · 113 citations · Full text

Engineering, Materials Engineering, Materials Science +17

Ion-implantation issues in the formation of shallow junctions in germanium

Eddy Simoen, A. Satta, A. D’Amore et al. · Materials Science in Semiconductor Processing · 2006 · 112 citations

Engineering, Materials Engineering, Materials Science +14

Characteristic trapping lifetime and capacitance-voltage measurements of GaAs metal-oxide-semiconductor structures

Guy Brammertz, Koen Martens, Sonja Sioncke et al. · Applied Physics Letters · 2007 · 101 citations

Engineering, Electrical Engineering, Materials Science +17

High-Performance Deep Submicron Ge pMOSFETs With Halo Implants

G. Nicholas, Brice De Jaeger, D.P. Brunco et al. · IEEE Transactions on Electron Devices · 2007 · 92 citations

Engineering, Electrical Engineering, Electronic Materials +12