Guy Brammertz

On the Correct Extraction of Interface Trap Density of MOS Devices With High-Mobility Semiconductor Substrates

Koen Martens, Chi On Chui, Guy Brammertz et al. · IEEE Transactions on Electron Devices · 2008 · 361 citations

Electrical Engineering, Mos Devices, Engineering +12

Characterization of defects in 9.7% efficient Cu2ZnSnSe4-CdS-ZnO solar cells

Guy Brammertz, Marie Buffière, Souhaib Oueslati et al. · Applied Physics Letters · 2013 · 215 citations

Materials Science, Ii-vi Semiconductor, Electrical Engineering +12

Capacitance-voltage characterization of GaAs–Al2O3 interfaces

Guy Brammertz, H. C. Lin, Koen Martens et al. · Applied Physics Letters · 2008 · 113 citations · Full text

Semiconductors, Wide-bandgap Semiconductor, Electrical Engineering +13

Electrical study of sulfur passivated In0.53Ga0.47As MOS capacitor and transistor with ALD Al2O3 as gate insulator

H. C. Lin, Wei Wang, Guy Brammertz et al. · Microelectronic Engineering · 2009 · 103 citations

Electrical Engineering, Engineering, Electronic Engineering +6

On the interface state density at In0.53Ga0.47As/oxide interfaces

Guy Brammertz, H. C. Lin, Matty Caymax et al. · Applied Physics Letters · 2009 · 102 citations

Wide-bandgap Semiconductor, Electrical Engineering, Conduction Band +14