Gate dielectric formation and MIS interface characterization on Ge - Concepedia

Concepedia

Publication | Closed Access

Gate dielectric formation and MIS interface characterization on Ge

105

Citations

28

References

2007

Year

Shinichi Takagi, Tatsuro Maeda, Noriyuki Taoka, Matsuhiko Nishizawa, Yukinori Morita, Keiji Ikeda, Y. Yamashita, Mitsuru Nishikawa, Hidenori Kumagai, Ryosho Nakane,

Microelectronic Engineering

Electrical EngineeringEngineeringBias Temperature InstabilityApplied PhysicsGate Dielectric FormationSemiconductor Device

References

	Year	Citations

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