Fumihiko Maeda

Microscopic thickness determination of thin graphite films formed on<mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" display="inline"><mml:mrow><mml:mi>SiC</mml:mi></mml:mrow></mml:math>from quantized oscillation in reflectivity of low-energy electrons

Hiroki Hibino, Hiroyuki Kageshima, Fumihiko Maeda et al. · Physical Review B · 2008 · 359 citations · Full text

Thin Film Physics, Engineering, Microscopic Thickness Determination +18

Dependence of electronic properties of epitaxial few-layer graphene on the number of layers investigated by photoelectron emission microscopy

Hiroki Hibino, Hiroyuki Kageshima, Masato Kotsugi et al. · Physical Review B · 2009 · 276 citations

Materials Science, Graphene Nanomeshes, Graphene Quantum Dot +12

Distinctly different thermal decomposition pathways of ultrathin oxide layer on Ge and Si surfaces

K. Prabhakaran, Fumihiko Maeda, Yasushi Watanabe et al. · Applied Physics Letters · 2000 · 252 citations

Engineering, Thermal Decomposition Pathway, Chemistry +18

Thermal decomposition pathway of Ge and Si oxides: observation of a distinct difference

K. Prabhakaran, Fumihiko Maeda, Yasushi Watanabe et al. · Thin Solid Films · 2000 · 105 citations

Materials Science, Materials Engineering, Distinct Difference +10

Surface and bulk core-level shifts of the Si(111)<i>√3 √3</i>-Ag surface: Evidence for a charged<i>√3 √3</i>layer

S. Kono, K. Higashiyama, T. Kinoshita et al. · Physical Review Letters · 1987 · 100 citations

Materials Science, Surface Characterization, Ii-vi Semiconductor +13