Hiroyuki Kageshima

Microscopic thickness determination of thin graphite films formed on<mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" display="inline"><mml:mrow><mml:mi>SiC</mml:mi></mml:mrow></mml:math>from quantized oscillation in reflectivity of low-energy electrons

Hiroki Hibino, Hiroyuki Kageshima, Fumihiko Maeda et al. · Physical Review B · 2008 · 359 citations · Full text

Thin Film Physics, Engineering, Microscopic Thickness Determination +18

Dependence of electronic properties of epitaxial few-layer graphene on the number of layers investigated by photoelectron emission microscopy

Hiroki Hibino, Hiroyuki Kageshima, Masato Kotsugi et al. · Physical Review B · 2009 · 276 citations

Materials Science, Graphene Nanomeshes, Graphene Quantum Dot +12

Momentum-matrix-element calculation using pseudopotentials

Hiroyuki Kageshima, Kenji Shiraishi · Physical review. B, Condensed matter · 1997 · 189 citations

Numerical Analysis, Materials Science, Engineering +14

Universal Theory of Si Oxidation Rate and Importance of Interfacial Si Emission

Hiroyuki Kageshima, Kenji Shiraishi, Masashi Uematsu · Japanese Journal of Applied Physics · 1999 · 157 citations

Materials Science, Electrical Engineering, Universal Theory +15

First-principles theory of scanning tunneling microscopy

Masaru Tsukada, Katsuyoshi Kobayashi, Nobuyuki Isshiki et al. · Surface Science Reports · 1991 · 126 citations

Engineering, Tunneling Microscopy, Microscopy +6