Microelectronic Engineering · 2007 · 49 citations · 6 references
EngineeringElectrical EngineeringMaterials EngineeringMicroelectronicsSemiconductor DevicesSemiconductor MaterialsSemiconductor Device MaterialsSemiconductor HeterostructuresSemiconductor InterfacesWide Band Gap SemiconductorsWide-bandgap Semiconductor DevicesWide-bandgap SemiconductorsGate Oxide Thickness EffectsSilicon CarbideSilicon Carbide (Sic) MaterialsSource-drain EngineeringSource-drain Leakage
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Improved performance of SiC MESFETs using double-recessed structure
C.L. Zhu, Rusli Rusli, C. C. Tin et al. · Microelectronic Engineering · 2005 · 77 citations