IEEE Transactions on Electron Devices · 1988 · 87 citations · 10 references
EngineeringComputer EngineeringElectrical EngineeringMicroelectronicsPower ElectronicsSemiconductor DevicesCurrent-voltage CharacteristicsDevice CharacterizationDevice ModelingDevice ReliabilityDevice SimulationSemiconductor ReliabilityCircuit SimulationCompact ModelingDigital Logic CircuitsHot-carrier DegradationLifetime PredictionMetal-oxide-semiconductor Field-effect Transistor ModelingMosfet ModelingReliability Simulation
A substrate current model and a quasistatic hot-electron-induced MOSFET degradation model have been implemented using the Substrate Current And Lifetime Evaluator (SCALE) package. It is shown that quasistatic simulation is valid for a class of waveforms that includes those encountered in inverter-based logic circuits. The validity and limitations of the model are illustrated with experimental results. SCALE is linked to SPICE externally in a pre- and postprocessor fashion to form an independent simulator. The preprocessor interprets the input deck and requests SPICE to output the transient node voltages of the user-selected devices. The postprocessor then calculates the transient substrate current and makes a lifetime prediction.< <ETX xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">></ETX>
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