P.K. Ko

Threshold voltage model for deep-submicrometer MOSFETs

zhenglin liu, Chenming Hu, Jiawei Huang et al. · IEEE Transactions on Electron Devices · 1993 · 480 citations

Engineering, Electrical Engineering, Electronic Materials +16

Dynamic threshold-voltage MOSFET (DTMOS) for ultra-low voltage VLSI

F. Assaderaghi, D. Sinitsky, S. Parke et al. · IEEE Transactions on Electron Devices · 1997 · 436 citations

Engineering, Computer Engineering, Electrical Engineering +15

The impact of gate-induced drain leakage current on MOSFET scaling

T.Y. Chan, J. Chen, P.K. Ko et al. · 1987 · 347 citations

Engineering, Electrical Engineering, Microelectronics +16

Random telegraph noise of deep-submicrometer MOSFETs

Kuo-Hsiang Hung, P.K. Ko, Chenming Hu et al. · IEEE Electron Device Letters · 1990 · 309 citations

Engineering, Electrical Engineering, Electronic Materials +16

Subbreakdown drain leakage current in MOSFET

J. Chen, T.Y. Chan, I.C. Chen et al. · IEEE Electron Device Letters · 1987 · 301 citations

Engineering, Electrical Engineering, Microelectronics +15