Concepedia

I.C. Chen

IC

Statistics

Publications

8

Citations

869

H-Index

8

Active since

1984

Affiliations

University of California, Berkeley(Current)

Semiconductor Manufacturing International (Italy)

Hodges University

I.C. Chen is an author at University of California, Berkeley specializing in engineering, microelectronics, and materials science.

Publications per year

1984–1987

8

Publications

8

Subbreakdown drain leakage current in MOSFET

J. Chen, T.Y. Chan, I.C. Chen et al. · IEEE Electron Device Letters · 1987 · 301 citations

Engineering, Electrical Engineering, Microelectronics +15

A quantitative physical model for time-dependent breakdown in SiO2

I.C. Chen, S. Holland, C. -Y. Hut · 1985 · 139 citations

Engineering, Materials Engineering, Materials Science +11

Hole trapping and breakdown in thin SiO<sub>2</sub>

I.C. Chen, S. Holland, Chenming Hu · IEEE Electron Device Letters · 1986 · 130 citations

Natural Sciences, Materials Science, Physics +13

On physical models for gate oxide breakdown

S. Holland, I.C. Chen, T.P. Ma et al. · IEEE Electron Device Letters · 1984 · 94 citations

Engineering, Electrical Engineering, Physics +17

Oxide breakdown dependence on thickness and hole current - enhanced reliability of ultra thin oxides

I.C. Chen, S. Holland, Chenming Hu · 1986 · 66 citations

Engineering, Electrical Engineering, Materials Science +16

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