T.P. Ma

Why is nonvolatile ferroelectric memory field-effect transistor still elusive?

T.P. Ma, Jin‐Ping Han · IEEE Electron Device Letters · 2002 · 516 citations

Engineering, Electrical Engineering, Materials Science +17

Making silicon nitride film a viable gate dielectric

T.P. Ma · IEEE Transactions on Electron Devices · 1998 · 383 citations

Natural Sciences, Materials Engineering, Materials Science +17

Effect of Al inclusion in HfO₂ on the physical and electrical properties of the dielectrics

Weihang Zhu, T. Tamagawa, M. Gibson et al. · IEEE Electron Device Letters · 2002 · 262 citations

Natural Sciences, Electrical Engineering, Materials Science +17

Mobility Measurement and Degradation Mechanisms of MOSFETs Made With Ultrathin High-k Dielectrics

Weihang Zhu, Jin‐Ping Han, T.P. Ma · IEEE Transactions on Electron Devices · 2004 · 257 citations

Engineering, Electrical Engineering, Materials Science +17

Direct tunneling gate leakage current in transistors with ultrathin silicon nitride gate dielectric

Yee‐Chia Yeo, Qiang Lü, Wen-Chin Lee et al. · IEEE Electron Device Letters · 2000 · 171 citations

Engineering, Electrical Engineering, Materials Science +17