M. Gibson

Effect of Al inclusion in HfO₂ on the physical and electrical properties of the dielectrics

Weihang Zhu, T. Tamagawa, M. Gibson et al. · IEEE Electron Device Letters · 2002 · 262 citations

Aluminium Nitride, Dielectrics, Engineering +19

HfO/sub 2/ and HfAlO for CMOS: thermal stability and current transport

Wenjuan Zhu, T.P. Ma, T. Tamagawa et al. · 2002 · 60 citations

Low-power Electronics, Electrical Engineering, Engineering +11

Plasma-assisted chemical vapor deposition and characterization of high quality silicon oxide films

S. Nguyen, D. Dobuzinsky, D. Döpp et al. · Thin Solid Films · 1990 · 29 citations

Materials Science, High Quality Silicon, Engineering +7

Nucleotide sequence of class D tetracycline resistance genes from Salmonella ordonez

John Allard, M. Gibson, Loan Vũ et al. · Molecular and General Genetics MGG · 1993 · 24 citations

Salmonella Ordonez, Antimicrobial Resistance Gene, Health Sciences +10

An analysis of Australian power transformer failure modes, and comparison with international Surveys

J. Marks, Daniel Martín, Tapan Kumar Saha et al. · 2016 · 14 citations

Reliability, Electrical Engineering, Reliability Engineering +15