M. Gibson

Effect of Al inclusion in HfO₂ on the physical and electrical properties of the dielectrics

Weihang Zhu, T. Tamagawa, M. Gibson et al. · IEEE Electron Device Letters · 2002 · 262 citations

Natural Sciences, Electrical Engineering, Materials Science +17

HfO/sub 2/ and HfAlO for CMOS: thermal stability and current transport

Wenjuan Zhu, T.P. Ma, T. Tamagawa et al. · 2002 · 60 citations

Engineering, Materials Science, Physics +17

Plasma-assisted chemical vapor deposition and characterization of high quality silicon oxide films

S. Nguyen, D. Dobuzinsky, D. Döpp et al. · Thin Solid Films · 1990 · 29 citations

Natural Sciences, Materials Engineering, Materials Science +14

Nucleotide sequence of class D tetracycline resistance genes from Salmonella ordonez

John Allard, M. Gibson, Loan Vũ et al. · Molecular and General Genetics MGG · 1993 · 24 citations

Life Sciences, Genetics, Microbiology +16

An analysis of Australian power transformer failure modes, and comparison with international Surveys

J. Marks, Daniel Martín, Tapan Kumar Saha et al. · 2016 · 14 citations

Natural Resources, Electrical Engineering, Demographic Methods +11