Qiang Lü

Direct tunneling gate leakage current in transistors with ultrathin silicon nitride gate dielectric

Yee‐Chia Yeo, Qiang Lü, Wen-Chin Lee et al. · IEEE Electron Device Letters · 2000 · 171 citations

Electrical Engineering, Engineering, Tunneling Microscopy +12

7-nm FinFET CMOS Design Enabled by Stress Engineering Using Si, Ge, and Sn

Suyog Gupta, Victor Moroz, Lee Smith et al. · IEEE Transactions on Electron Devices · 2014 · 97 citations

Materials Engineering, Electrical Engineering, Engineering +14

A unified gate oxide reliability model

Chenming Hu, Qiang Lü · 2003 · 91 citations

Engineering, Oxide Reliability, Hardware Security +17

Silica-/titania-coated Y2O3:Tm3+, Yb3+ nanoparticles with improvement in upconversion luminescence induced by different thickness shells

Qiang Lü, FengYun Guo, L. Sun et al. · Journal of Applied Physics · 2008 · 90 citations

Materials Science, Chemical Engineering, Sintering +15

Experimental study on the surface modification of Y₂O₃:Tm³⁺/Yb³⁺nanoparticles to enhance upconversion fluorescence and weaken aggregation

Qiang Lü, AiHua Li, FengYun Guo et al. · Nanotechnology · 2008 · 78 citations

Nanoparticles, Chemical Engineering, Engineering +15