Statistics
Publications
7
Citations
834
H-Index
7
Active since
1987
Affiliations
J. Chen is an author at University of California, Berkeley specializing in engineering, metal-oxide-semiconductor field-effect transistors, and semiconductor devices.
Publications per year
1987–2017
7
7
The impact of gate-induced drain leakage current on MOSFET scaling
Subbreakdown drain leakage current in MOSFET
J. Chen, T.Y. Chan, I.C. Chen et al. · IEEE Electron Device Letters · 1987 · 301 citations
J. Chen, F. Assaderaghi, P.K. Ko et al. · IEEE Electron Device Letters · 1992 · 86 citations
Gate current in OFF-state MOSFET
J. Chen, T.Y. Chan, P.K. Ko et al. · IEEE Electron Device Letters · 1989 · 27 citations
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