T.Y. Chan

Threshold voltage model for deep-submicrometer MOSFETs

zhenglin liu, Chenming Hu, Jiawei Huang et al. · IEEE Transactions on Electron Devices · 1993 · 480 citations

Engineering, Electrical Engineering, Electronic Materials +16

The impact of gate-induced drain leakage current on MOSFET scaling

T.Y. Chan, J. Chen, P.K. Ko et al. · 1987 · 347 citations

Engineering, Electrical Engineering, Microelectronics +16

Subbreakdown drain leakage current in MOSFET

J. Chen, T.Y. Chan, I.C. Chen et al. · IEEE Electron Device Letters · 1987 · 301 citations

Engineering, Electrical Engineering, Microelectronics +15

A simple method to characterize substrate current in MOSFET's

T.Y. Chan, P.K. Ko, Chenming Hu · IEEE Electron Device Letters · 1984 · 192 citations

Engineering, Electrical Engineering, Microelectronics +15

Dependence of channel electric field on device scaling

T.Y. Chan, P.K. Ko, Chenming Hu · IEEE Electron Device Letters · 1985 · 141 citations

Engineering, Electrical Engineering, Microelectronics +16