T.Y. Chan

Threshold voltage model for deep-submicrometer MOSFETs

zhenglin liu, Chenming Hu, Jiawei Huang et al. · IEEE Transactions on Electron Devices · 1993 · 478 citations

Low-power Electronics, Device Modeling, Electrical Engineering +10

The impact of gate-induced drain leakage current on MOSFET scaling

T.Y. Chan, J. Chen, P.K. Ko et al. · 1987 · 344 citations

Device Modeling, Electrical Engineering, Engineering +11

Subbreakdown drain leakage current in MOSFET

J. Chen, T.Y. Chan, I.C. Chen et al. · IEEE Electron Device Letters · 1987 · 300 citations

Semiconductor Technology, Electrical Engineering, Engineering +9

A simple method to characterize substrate current in MOSFET's

T.Y. Chan, P.K. Ko, Chenming Hu · IEEE Electron Device Letters · 1984 · 192 citations

Device Modeling, Substrate Current Characteristics, Electrical Engineering +14

Dependence of channel electric field on device scaling

T.Y. Chan, P.K. Ko, Chenming Hu · IEEE Electron Device Letters · 1985 · 140 citations

Device Modeling, Electrical Engineering, Engineering +11