P.K. Ko

A unified model for the flicker noise in metal-oxide-semiconductor field-effect transistors

Kuo-Hsiang Hung, P.K. Ko, Chenming Hu et al. · IEEE Transactions on Electron Devices · 1990 · 881 citations

Engineering, Electrical Engineering, Microelectronics +16

BSIM: Berkeley short-channel IGFET model for MOS transistors

B.J. Sheu, D.L. Scharfetter, P.K. Ko et al. · IEEE Journal of Solid-State Circuits · 1987 · 585 citations

Engineering, Computer Engineering, Electrical Engineering +17

A physics-based MOSFET noise model for circuit simulators

Kuo-Hsiang Hung, P.K. Ko, Chenming Hu et al. · IEEE Transactions on Electron Devices · 1990 · 256 citations

Engineering, Electrical Engineering, Physics +17

A dynamic threshold voltage MOSFET (DTMOS) for ultra-low voltage operation

F. Assaderaghi, D. Sinitsky, S. Parke et al. · 2002 · 212 citations

Engineering, Electrical Engineering, Microelectronics +16

Berkeley reliability tools-BERT

R. Tu, Elyse Rosenbaum, Wayne Chan et al. · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 1993 · 197 citations

Engineering, Computer Engineering, Electrical Engineering +17