Elyse Rosenbaum

Analytic model for direct tunneling current in polycrystalline silicon-gate metal–oxide–semiconductor devices

Leonard F. Register, Elyse Rosenbaum, Kevin Yang · Applied Physics Letters · 1999 · 235 citations

Device Modeling, Semiconductors, Electrical Engineering +14

Mechanism of stress-induced leakage current in MOS capacitors

Elyse Rosenbaum, Leonard F. Register · IEEE Transactions on Electron Devices · 1997 · 200 citations

Electrical Engineering, Engineering, Tunneling Microscopy +12

Berkeley reliability tools-BERT

R. Tu, Elyse Rosenbaum, Wayne Chan et al. · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 1993 · 196 citations

Software Maintenance, Software Reliability Testing, Engineering +25

ILLIADS-T: an electrothermal timing simulator for temperature-sensitive reliability diagnosis of CMOS VLSI chips

Yi-Kan Cheng, P. Raha, Chin-Chi Teng et al. · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 1998 · 140 citations

Engineering, Vlsi Design, Computer Architecture +19

Interconnect thermal modeling for accurate simulation of circuit timing and reliability

Danqing Chen, Erhong Li, Elyse Rosenbaum et al. · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 2000 · 104 citations

Engineering, Interconnect Thermal Modeling, Accurate Simulation +25