G. Dorda

New Method for High-Accuracy Determination of the Fine-Structure Constant Based on Quantized Hall Resistance

K. von Klitzing, G. Dorda, M. Pepper · Physical Review Letters · 1980 · 6.8K citations · Full text

Engineering, Semiconductor Device, Nanoelectronics +16

Hot-electron and hole-emission effects in short n-channel MOSFET's

K.R. Hofmann, C. Werner, W. Weber et al. · IEEE Transactions on Electron Devices · 1985 · 315 citations

Electrical Engineering, Semiconductor Device, Engineering +12

Cyclotron resonance of electrons in surface space-charge layers on silicon

G. Abstreiter, J. P. Kotthaus, J. F. Koch et al. · Physical review. B, Solid state · 1976 · 186 citations

Resonance Spectroscopy of Electronic Levels in a Surface Accumulation Layer

Avid Kamgar, P. Kneschaurek, G. Dorda et al. · Physical Review Letters · 1974 · 113 citations

Engineering, Electronic Excited State, Accumulation Layer +16

Piezoresistance in Quantized Conduction Bands in Silicon Inversion Layers

G. Dorda · Journal of Applied Physics · 1971 · 113 citations

Surface Characterization, Electrical Engineering, Engineering +15