C. Werner

Hot-electron and hole-emission effects in short n-channel MOSFET's

K.R. Hofmann, C. Werner, W. Weber et al. · IEEE Transactions on Electron Devices · 1985 · 315 citations

Engineering, Electrical Engineering, Electronic Materials +16

Corrosion behaviour of ionic liquids

Marc Uerdingen, Claudia Treber, Martina Balser et al. · Green Chemistry · 2005 · 227 citations

Natural Sciences, Materials Engineering, Materials Science +17

Degradation of n-MOS-Transistors after pulsed stress

W. Weber, C. Werner, G. Dorda · IEEE Electron Device Letters · 1984 · 67 citations

Engineering, Electrical Engineering, Electronic Materials +15

Lifetimes and substrate currents in static and dynamic hot-carrier degradation

W. Weber, C. Werner, A. v. Schwerin · 1986 · 58 citations

Engineering, Electrical Engineering, Electronic Materials +16

Selfconsistent simulation of sputter deposition with the Monte Carlo method

Alfred Kersch, William J. Morokoff, C. Werner · Journal of Applied Physics · 1994 · 56 citations

Natural Sciences, Materials Science, Physics +17