Jeong Y. Choi

Simulation of MOSFET lifetime under AC hot-electron stress

Ming-Chang Kuo, Kazuhiko Seki, Pei-Wen Lee et al. · IEEE Transactions on Electron Devices · 1988 · 87 citations

Engineering, Computer Engineering, Electrical Engineering +17

Hot-carrier-induced MOSFET degradation under AC stress

Jeong Y. Choi, P.K. Ko, Chenming Hu · IEEE Electron Device Letters · 1987 · 67 citations

Engineering, Electrical Engineering, Microelectronics +16

Effect of oxide field on hot-carrier-induced degradation of metal-oxide-semiconductor field-effect transistors

Jeong Y. Choi, P.K. Ko, Chenming Hu · Applied Physics Letters · 1987 · 32 citations

Engineering, Electrical Engineering, Materials Science +17

Modeling the turn-off characteristics of the bipolar-MOS transistor

D.S. Kuo, Jeong Y. Choi, David Giandomenico et al. · IEEE Electron Device Letters · 1985 · 31 citations

Engineering, Electrical Engineering, Circuit Theory +14

Hot-Carrier-Induced MOSFET Degradation: AC Versus DC Stressing

Jeong Y. Choi, P.K. Ko, Chenming Hu · Rare & Special e-Zone (The Hong Kong University of Science and Technology) · 1987 · 22 citations

Engineering, Electrical Engineering, Electronic Materials +16