Pei-Wen Lee

Statistics

Publications

Citations

118

H-Index

Active since

1988

Affiliations

University of California, Berkeley(Current)

Pei-Wen Lee is an author at University of California, Berkeley specializing in hot-carrier degradation, device characterization, and semiconductor reliability.

Publications per year

1988–1990

Publications

Simulation of MOSFET lifetime under AC hot-electron stress

Ming-Chang Kuo, Kazuhiko Seki, Pei-Wen Lee et al. · IEEE Transactions on Electron Devices · 1988 · 87 citations

Engineering, Computer Engineering, Electrical Engineering +17

Relating CMOS inverter lifetime to DC hot-carrier lifetime of NMOSFETs

Pei-Wen Lee, P.K. Ko, Chenming Hu · IEEE Electron Device Letters · 1990 · 31 citations

Engineering, Electrical Engineering, Aging +15

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