2004 · 68 citations · 10 references
EngineeringComputer EngineeringElectrical EngineeringFault-tolerant ComputingMicroelectronicsSystem-on-chip DesignDefect DetectionDelay ModelingDesign For TestabilityFault DetectionTiming AnalysisTiming ModelingDelay Fault TestingDelay Timing MeasurementRing OscillatorsTiming CharacterizationTiming Error AnalysisTiming Error DetectionTiming FaultsTransition Fault Testing
This paper presents delay test data collected from test chips fabricated in a 0.18 /spl mu/ technology. The experimental data shows that process monitor structures such as on-chip ring oscillators are effective in identifying slow parts while performing transition fault testing at frequencies slower than the rated frequency.
10
Scan-based transition fault testing - implementation and low cost test challenges
J. Saxena, Kenneth M. Butler, J. Gatt et al. · 2003 · 130 citations
Engineering, Computer Engineering, Electrical Engineering +14
Multiple-output propagation transition fault test
Chao-Wen Tseng, E.J. McCluskey · 2002 · 90 citations