Wangqi Qiu

An efficient algorithm for finding the k longest testable paths through each gate in a combinational circuit

Wangqi Qiu, D.M.H. Walker · 2004 · 120 citations

Circuit Complexity, Engineering, Test Data Generation +18

K longest paths per gate (KLPG) test generation for scan-based sequential circuits

Wangqi Qiu, Jing Wang, D.M.H. Walker et al. · 2004 · 116 citations

Engineering, Mem Testing, Computer Architecture +20

Longest-path selection for delay test under process variation

Xiang Lü, Zhuo Li, Wangqi Qiu et al. · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 2005 · 50 citations

Engineering, Process Variation, Computer Architecture +20

A circuit level fault model for resistive bridges

Zhuo Li, Xiang Lü, Wangqi Qiu et al. · ACM Transactions on Design Automation of Electronic Systems · 2003 · 40 citations

Engineering, Delay Faults, Structural Engineering +19

A vector-based approach for power supply noise analysis in test compaction

Jing Wang, Ziding Yue, Xiang Lü et al. · 2006 · 38 citations

Test Compaction, Electrical Engineering, Iscas89 Circuits +15