Design For Testability

Design for Testability is a design methodology in integrated circuit development that belongs to the class of design optimization techniques and is distinguished by its focus on embedding structural features to facilitate efficient fault detection and diagnosis during manufacturing testing.

11K

Publications

433.2K

Citations

17.3K

Authors

2.5K

Institutions

Publications per year

2017–2026

870

Variants

Dft

Parents

System-on-chip DesignVlsi Design

Children

Analog TestabilityAt-speed TestingAutomatic Test Pattern GenerationBoundary ScanBuilt-in Self-repairDefect ToleranceDelay Fault TestingDesign For ScanabilityDesign For Test CoverageDiagnostic Test Generation

Publications

11K

Combinational profiles of sequential benchmark circuits

F. Brglez, D. Bryan, Krzysztof Koźmiński · 2003 · 2.1K citations

Engineering, Computer Engineering, Computer Science +17

Binary Decision Diagrams

Akers · IEEE Transactions on Computers · 1978 · 1.8K citations

Engineering, Computer Engineering, Computer Science +17

Common test conditions and software reference configurations

Frank Bossen · Medical Entomology and Zoology · 2010 · 1.6K citations

Engineering, Systems Engineering, Test Development +10

Digital Systems : Testing and Testable Design

European Journal of Operational Research · 1990 · 1.5K citations

Engineering, Computer Engineering, Systems Engineering +14

Testing Software Design Modeled by Finite-State Machines

Tsun S. Chow · IEEE Transactions on Software Engineering · 1978 · 1.4K citations

Computing, Computer Science, Fault-tolerant Systems +15

1–5 of 11K

Authors

17.3K

SR
S.M. Reddy
University of Iowa, United States
250 publications · 11K citations
53
h-index
KC
Krishnendu Chakrabarty
Duke University, United States
230 publications · 9.6K citations
52
h-index
IP
Irith Pomeranz
University of Iowa, United States
221 publications · 7.7K citations
46
h-index
EJ
Erik Jan Marinissen
IMEC, Belgium
89 publications · 6.2K citations
43
h-index
KC
Kwang‐Ting Cheng
University of California, Santa Barbara, United States
138 publications · 6.1K citations
43
h-index

1–5 of 17.3K

Institutions

2.5K

1–8 of 2.5K

Venues

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
617 publications · 31.1K citations
86
h-index
IEEE Transactions on Computers
425 publications · 29K citations
83
h-index
IEEE Design & Test of Computers
254 publications · 14.3K citations
59
h-index
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
218 publications · 7.3K citations
45
h-index
IEEE Transactions on Nuclear Science
151 publications · 6.7K citations
44
h-index

1–5