Automatic Test Pattern Generation

Automatic Test Pattern Generation is a computational method in the field of design for testability that systematically determines input stimuli required to detect faults in digital circuits by analyzing circuit structure and fault models.

724

Publications

29K

Citations

1.3K

Authors

368

Institutions

Publications per year

2017–2026

Variants

Atpg

Parents

Design For Testability

Publications

724

Test pattern generation using Boolean satisfiability

T. Larrabee · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 1992 · 702 citations

Engineering, Computer Engineering, Computer Science +15

SOCRATES: a highly efficient automatic test pattern generation system

Michael Schulz, E. Trischler, T.M. Sarfert · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 1988 · 573 citations

Engineering, Computer Engineering, Computer Science +12

HITEC: a test generation package for sequential circuits

T.M. Niermann, J.H. Patel · 2002 · 522 citations

Engineering, Computer Engineering, Computer Science +15

Test set compaction algorithms for combinational circuits

İlker Hamzaoğlu, J.H. Patel · 1998 · 432 citations · Full text

Engineering, Computer Engineering, Computer Science +14

A partial scan method for sequential circuits with feedback

Kwang‐Ting Cheng, Vishwani D. Agrawal · IEEE Transactions on Computers · 1990 · 355 citations

Engineering, Computer Engineering, Electrical Engineering +17

1–5 of 724

Authors

1.3K

SR
S.M. Reddy
University of Iowa, United States
35 publications · 1.7K citations
21
h-index
JP
J.H. Patel
University of Illinois Urbana-Champaign, United States
20 publications · 1.8K citations
19
h-index
JR
Janusz Rajski
Mentor Technologies, United States
21 publications · 662 citations
17
h-index
KC
Kwang‐Ting Cheng
University of California, Santa Barbara, United States
21 publications · 1.2K citations
17
h-index
IP
Irith Pomeranz
University of Iowa, United States
26 publications · 1.4K citations
16
h-index

1–5 of 1.3K

Institutions

368

1–8 of 368

Venues

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
103 publications · 6K citations
37
h-index
IEEE Transactions on Computers
30 publications · 2.2K citations
22
h-index
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
25 publications · 661 citations
16
h-index
IEEE Design & Test of Computers
14 publications · 683 citations
13
h-index
Design Automation Conference
Conference · 11 publications · 388 citations
11
h-index

1–5