Janusz Rajski

Embedded Deterministic Test

Janusz Rajski, Jerzy Tyszer, Mark Kassab et al. · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 2004 · 526 citations

Engineering, Computer Engineering, Computer Science +13

Built-in test for circuits with scan based on reseeding of multiple-polynomial linear feedback shift registers

Sybille Hellebrand, Janusz Rajski, Steffen Tarnick et al. · IEEE Transactions on Computers · 1995 · 408 citations

Engineering, Computer Engineering, Computer Science +14

Preferred Fill: A Scalable Method to Reduce Capture Power for Scan Based Designs

Santiago Remersaro, Xijiang Lin, Zhuo Zhang et al. · Proceedings/Proceedings - International Test Conference · 2006 · 239 citations

Engineering, Computer Engineering, Electrical Engineering +17

A method of fault analysis for test generation and fault diagnosis

Henry Cox, Janusz Rajski · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 1988 · 159 citations

Engineering, Computer Engineering, Electrical Engineering +17

High-frequency, at-speed scan testing

Xijiiang Lin, Ron Press, Janusz Rajski et al. · IEEE Design & Test of Computers · 2003 · 156 citations

Engineering, Computer Engineering, Computer Science +13