Steffen Tarnick

Built-in test for circuits with scan based on reseeding of multiple-polynomial linear feedback shift registers

Sybille Hellebrand, Janusz Rajski, Steffen Tarnick et al. · IEEE Transactions on Computers · 1995 · 405 citations

Engineering, Mem Testing, Verification +21

GENERATION OF VECTOR PATTTERNS THROUGH RESEEDING OF MUETIPLE-POLYNOMIAL LINEAR FEEDBACK SHIFT REGIST

Sybille Hellebrand, Steffen Tarnick, J. Rajski et al. · 2005 · 132 citations

Signal Processing, Engineering, Computer Engineering

Pattern generation for a deterministic BIST scheme

Sybille Hellebrand, Birgit Reeb, Steffen Tarnick et al. · Proceedings of IEEE International Conference on Computer Aided Design (ICCAD) · 2002 · 105 citations

Mathematical Programming, Bist Scheme, Engineering +19

An Efficient Bist Scheme Based On Reseeding Of Multiple Polynomial Linear Feedback Shift Registers

S. Venkataraman, Janusz Rajski, Sybille Hellebrand et al. · Proceedings of 1993 International Conference on Computer Aided Design (ICCAD) · 2005 · 102 citations

Engineering, Vlsi Design, Pseudo-random Sequence +19

Self-checking comparator with one periodic output

Sandip Kundu, E.S. Sogomonyan, M. Goessel et al. · IEEE Transactions on Computers · 1996 · 43 citations

Equality Checker, Engineering, Self-checking Comparator +12