Jerzy Tyszer

Embedded Deterministic Test

Janusz Rajski, Jerzy Tyszer, Mark Kassab et al. · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 2004 · 526 citations

Engineering, Computer Engineering, Computer Science +13

Embedded deterministic test for low cost manufacturing test

J. Rajski, Jerzy Tyszer, Mark Kassab et al. · 2003 · 402 citations

Engineering, Computer Engineering, Electrical Engineering +13

Convolutional compaction of test responses

Janusz Rajski, Jerzy Tyszer, Chen Wang et al. · 2004 · 140 citations

Engineering, Computer Engineering, Electrical Engineering +16

Ring Generators—New Devices for Embedded Test Applications

Grzegorz Mrugalski, J. Rajski, Jerzy Tyszer · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 2004 · 117 citations

Engineering, Computer Engineering, Electrical Engineering +14

Test data decompression for multiple scan designs with boundary scan

Janusz Rajski, Jerzy Tyszer, N. Zacharia · IEEE Transactions on Computers · 1998 · 93 citations

Engineering, Computer Engineering, Computer Science +14