Mark Kassab

Embedded Deterministic Test

Janusz Rajski, Jerzy Tyszer, Mark Kassab et al. · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 2004 · 518 citations

Engineering, Mem Testing, Verification +19

Embedded deterministic test for low cost manufacturing test

J. Rajski, Jerzy Tyszer, Mark Kassab et al. · 2003 · 400 citations

Engineering, Industrial Engineering, Mem Testing +18

Logic BIST for large industrial designs: real issues and case studies

G. Hetherington, T. Fryars, N. Tamarapalli et al. · 2003 · 281 citations

Engineering, Industrial Engineering, Electronic Design Automation +18

Timing-Aware ATPG for High Quality At-speed Testing of Small Delay Defects

Xijiang Lin, Kun-Han Tsai, Chen Wang et al. · Proceedings - Asian Test Symposium/Proceedings · 2006 · 132 citations

Engineering, New Atpg Methodology, Mem Testing +16

At-speed scan test with low switching activity

Elham Moghaddam, Janusz Rajski, Mark Kassab et al. · 2010 · 78 citations

Engineering, Measurement, Mem Testing +17