2
Publications
554
Citations
2
H-Index
2003
Active since
Affiliations
Texas Instruments (United States)(Current)
T. Fryars is an author at Texas Instruments (United States) specializing in built-in self-test, design for testing, and engineering.
Top concepts
EngineeringSoftware TestingBuilt-in Self-testDesign For TestingComputer EngineeringEducationRadiologyMeasurementCircuit DesignFormal Methods
Publications per year
2003–2005
2
2
Logic BIST for large industrial designs: real issues and case studies
G. Hetherington, T. Fryars, N. Tamarapalli et al. · 2003 · 281 citations
Engineering, Industrial Engineering, Electronic Design Automation +18
Minimizing power consumption in scan testing: pattern generation and DFT techniques
Kenneth M. Butler, J. Saxena, Ankit Jain et al. · 2005 · 273 citations
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