Kenneth M. Butler

A case study of ir-drop in structured at-speed testing

J. Saxena, Kenneth M. Butler, Vinay Jayaram et al. · 2004 · 399 citations

At-speed Test, Engineering, Vlsi Design +18

Minimizing power consumption in scan testing: pattern generation and DFT techniques

Kenneth M. Butler, J. Saxena, Ankit Jain et al. · 2005 · 273 citations

Engineering, Measurement, Power Optimization (Eda) +19

An analysis of power reduction techniques in scan testing

J. Saxena, Kenneth M. Butler, L. Whetsel · 2002 · 167 citations

Engineering, Measurement, Power Optimization (Eda) +20

An experimental study comparing the relative effectiveness of functional, scan, IDDq and delay-fault testing

P. Nigh, W. Needham, Kenneth M. Butler et al. · 2002 · 140 citations

Engineering, Verification, Diagnosis +25

Scan-based transition fault testing - implementation and low cost test challenges

J. Saxena, Kenneth M. Butler, J. Gatt et al. · 2003 · 130 citations

Engineering, Mem Testing, Verification +21