2
Publications
162
Citations
2
H-Index
2001
Active since
Affiliations
Tecumseh Products (United States)(Current)
J. Gatt is an author at Tecumseh Products (United States) specializing in semiconductor industry, software testing, and built-in self-test.
Top concepts
EngineeringVerificationFormal MethodsComputer ScienceMicroelectronicsProgram AnalysisSoftware TestingSoftware AnalysisBuilt-in Self-testDesign For Testing
Publications per year
2001–2003
2
2
Scan-based transition fault testing - implementation and low cost test challenges
J. Saxena, Kenneth M. Butler, J. Gatt et al. · 2003 · 130 citations
Rows per page
1–2 of 2