J. Saxena

A case study of ir-drop in structured at-speed testing

J. Saxena, Kenneth M. Butler, Vinay Jayaram et al. · 2004 · 403 citations

Engineering, Computer Engineering, Electrical Engineering +14

Minimizing power consumption in scan testing: pattern generation and DFT techniques

Kenneth M. Butler, J. Saxena, Ankit Jain et al. · 2005 · 275 citations

Engineering, Computer Engineering, Electrical Engineering +17

An analysis of power reduction techniques in scan testing

J. Saxena, Kenneth M. Butler, L. Whetsel · 2002 · 167 citations

Engineering, Computer Engineering, Electrical Engineering +16

Scan-based transition fault testing - implementation and low cost test challenges

J. Saxena, Kenneth M. Butler, J. Gatt et al. · 2003 · 130 citations

Engineering, Computer Engineering, Electrical Engineering +14

A design for testability scheme to reduce test application time in full scan

Dhiraj K. Pradhan, J. Saxena · 2003 · 57 citations

Engineering, Computer Engineering, Electrical Engineering +14