2002 · 167 citations · 12 references
EngineeringMeasurementPower Optimization (Eda)EducationPower ElectronicsSoftware AnalysisInstantaneous Power ConsumptionElectromagnetic CompatibilityHardware SecurityReliability EngineeringInstrumentationPower-aware DesignElectrical EngineeringTesting TechniqueComputer EngineeringBuilt-in Self-testComputer SciencePower ConsumptionDesign For TestingLow-power ElectronicsProgram AnalysisSoftware TestingScan Testing
Power consumption during scan testing is becoming a concern. Circuit switching activity during scan shifting is high and results in high average and instantaneous power consumption. This paper presents a scheme for reducing power and provides analysis results on an industrial design.
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Combinational profiles of sequential benchmark circuits
F. Brglez, D. Bryan, Krzysztof Koźmiński · 2003 · 2.1K citations
V. Dabholkar, S. Chakravarty, Irith Pomeranz et al. · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 1998 · 317 citations
Adapting scan architectures for low power operation
L. Whetsel · 2002 · 265 citations
Engineering, Computer Architecture, Adapted Scan Architectures +17