Concepedia

W. Needham

WN

6

Publications

474

Citations

6

H-Index

1946

Active since

Affiliations

Intel (United States)(Current)

Hewlett-Packard (United States)

Texas Instruments (United States)

IBM (United States)

W. Needham is an author at Intel (United States) specializing in engineering, microelectronics, and software testing.

Top concepts

EngineeringMicroelectronicsSoftware TestingDesign For TestingComputer EngineeringTechnologyComputer ScienceBuilt-in Self-testElectrical EngineeringReliability

Publications per year

1946–2002

6

Publications

6

High volume microprocessor test escapes, an analysis of defects our tests are missing

W. Needham, C. Prunty, Eng‐Kiong Yeoh · 2002 · 185 citations

Engineering, Industrial Engineering, Root Cause +22

An experimental study comparing the relative effectiveness of functional, scan, IDDq and delay-fault testing

P. Nigh, W. Needham, Kenneth M. Butler et al. · 2002 · 140 citations

Engineering, Verification, Diagnosis +25

So what is an optimal test mix? A discussion of the SEMATECH methods experiment

P. Nigh, W. Needham, Kenneth M. Butler et al. · 2002 · 94 citations

Sematech Member Companies, Engineering, Industrial Engineering +20

DFT strategy for Intel microprocessors

W. Needham, N. Gollakota · 2002 · 21 citations

Hardware Security, Dft Techniques, Hardware Architecture +15

Silicon carbide non-ohmic resistors

F.P.O. Ashworth, W. Needham, R.W. Sillars · Journal of the Institution of Electrical Engineers, Part 1, General · 1946 · 19 citations

Electrical Engineering, Engineering, Resistor +12

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