Concepedia
Statistics
Publications
6
Citations
478
H-Index
Active since
1946
Affiliations
Intel (United States)(Current)
Hewlett-Packard (United States)
Texas Instruments (United States)
IBM (United States)
W. Needham is an author at Intel (United States) specializing in engineering, design for testability, and microelectronics.
Publications per year
1946–2002
High volume microprocessor test escapes, an analysis of defects our tests are missing
W. Needham, C. Prunty, Eng‐Kiong Yeoh · 2002 · 186 citations
Engineering, Electrical Engineering, Manufacturing Engineering +17
An experimental study comparing the relative effectiveness of functional, scan, IDDq and delay-fault testing
P. Nigh, W. Needham, Kenneth M. Butler et al. · 2002 · 142 citations
Engineering, Computer Engineering, Electrical Engineering +16
So what is an optimal test mix? A discussion of the SEMATECH methods experiment
P. Nigh, W. Needham, Kenneth M. Butler et al. · 2002 · 94 citations
Engineering, Computer Engineering, Experimental Design +8
DFT strategy for Intel microprocessors
W. Needham, N. Gollakota · 2002 · 21 citations
Engineering, Computer Engineering, Computer Science +11
Silicon carbide non-ohmic resistors
F.P.O. Ashworth, W. Needham · Journal of the Institution of Electrical Engineers, Part 1, General · 1946 · 19 citations
Engineering, Electrical Engineering, Materials Science +17
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