N. Tamarapalli

Embedded deterministic test for low cost manufacturing test

J. Rajski, Jerzy Tyszer, Mark Kassab et al. · 2003 · 400 citations

Engineering, Industrial Engineering, Mem Testing +18

Logic BIST for large industrial designs: real issues and case studies

G. Hetherington, T. Fryars, N. Tamarapalli et al. · 2003 · 281 citations

Engineering, Industrial Engineering, Electronic Design Automation +18

Impact of multiple-detect test patterns on product quality

Brady Benware, Chris Schuermyer, N. Tamarapalli et al. · 2004 · 158 citations

Total Quality Management, Engineering, Diagnosis +20

High-frequency, at-speed scan testing

Xijiiang Lin, Ron Press, Janusz Rajski et al. · IEEE Design & Test of Computers · 2003 · 155 citations

Internal Pll, Engineering, Measurement +20

Constructive multi-phase test point insertion for scan-based BIST

N. Tamarapalli, J. Rajski · 2002 · 137 citations

Engineering, Test Coverage, Electromagnetic Compatibility +17