N. Tamarapalli

Embedded deterministic test for low cost manufacturing test

J. Rajski, Jerzy Tyszer, Mark Kassab et al. · 2003 · 402 citations

Engineering, Computer Engineering, Electrical Engineering +13

Logic BIST for large industrial designs: real issues and case studies

G. Hetherington, T. Fryars, N. Tamarapalli et al. · 2003 · 284 citations

Engineering, Computer Engineering, Electrical Engineering +16

Impact of multiple-detect test patterns on product quality

Brady Benware, Chris Schuermyer, N. Tamarapalli et al. · 2004 · 159 citations

Management, Manufacturing Engineering, Quality Assurance +13

High-frequency, at-speed scan testing

Xijiiang Lin, Ron Press, Janusz Rajski et al. · IEEE Design & Test of Computers · 2003 · 156 citations

Engineering, Computer Engineering, Computer Science +13

Constructive multi-phase test point insertion for scan-based BIST

N. Tamarapalli, J. Rajski · 2002 · 139 citations

Engineering, Computer Engineering, Electrical Engineering +12