Chris Schuermyer

Impact of multiple-detect test patterns on product quality

Brady Benware, Chris Schuermyer, N. Tamarapalli et al. · 2004 · 159 citations

Management, Manufacturing Engineering, Quality Assurance +13

A Rapid Yield Learning Flow Based on Production Integrated Layout-Aware Diagnosis

Martin Keim, N. Tamarapalli, Huaxing Tang et al. · Proceedings/Proceedings - International Test Conference · 2006 · 72 citations

Engineering, Manufacturing Engineering, Design Automation +13

Screening minVDD outliers using feed-forward voltage testing

R. Madge, B. H. T. Goh, Venkatesh Rajagopalan et al. · 2003 · 67 citations

Engineering, Computer Engineering, Electrical Engineering +13

In search of the optimum test set - adaptive test methods for maximum defect coverage and lowest test cost

R. Madge, Brady Benware, Ritesh Turakhia et al. · 2005 · 56 citations

Management, Computer Engineering, Quality Assurance +15

</title> </titles> <publication_date> <month>02</month> <year>2012</year> </publication_date> <pages> <first_page>64</first_page> <last_page>64</last_page> </pages> <publisher_item> <item_number item_number_type='arNumber'>6198433</item_number> </publisher_item> <doi_data> <doi>10.1109/MDT.2012.2196611</doi> <resource>http://ieeexplore.ieee.org/lpdocs/epic03/wrapper.htm?arnumber=6198433</resource> </doi_data> </journal_article> <journal_article> <titles> <title><![CDATA[</title> </titles> <publication_date> <month>02</month> <year>2012</year> </publication_date> <pages> <first_page>72</first_page> <last_page>72</last_page> </pages> <publisher_item> <item_number item_number_type='arNumber'>6198434</item_number> </publisher_item> <doi_data> <doi>10.1109/MDT.2012.2196612</doi> <resource>http://ieeexplore.ieee.org/lpdocs/epic03/wrapper.htm?arnumber=6198434</resource> </doi_data> </journal_article> <journal_article> <titles> <title><![CDATA[</title> </titles> <publication_date> <month>02</month> <year>2012</year> </publication_date> <pages> <first_page>79</first_page> <last_page>79</last_page> </pages> <publisher_item> <item_number item_number_type='arNumber'>6198435</item_number> </publisher_item> <doi_data> <doi>10.1109/MDT.2012.2196613</doi> <resource>http://ieeexplore.ieee.org/lpdocs/epic03/wrapper.htm?arnumber=6198435</resource> </doi_data> </journal_article> <journal_article> <titles> <title><![CDATA[Determining a Failure Root Cause Distribution From a Population of Layout-Aware Scan Diagnosis Results

Brady Benware, Chris Schuermyer, Manish Sharma et al. · IEEE Design & Test of Computers · 2012 · 48 citations

Engineering, Electrical Engineering, Microelectronics +4