Martin Keim

Cell-Aware Test

Friedrich Hapke, W. Redemund, Andreas Glowatz et al. · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 2014 · 185 citations · Full text

Hardware Security, Electrical Engineering, Physical Design (Electronics) +14

Analyzing Volume Diagnosis Results with Statistical Learning for Yield Improvement

Huaxing Tang, Manish Sharma, Janusz Rajski et al. · Proceedings/Proceedings - European Test Workshop · 2007 · 88 citations

Fault Diagnosis, Engineering, Machine Learning +22

A Rapid Yield Learning Flow Based on Production Integrated Layout-Aware Diagnosis

Martin Keim, N. Tamarapalli, Huaxing Tang et al. · Proceedings/Proceedings - International Test Conference · 2006 · 72 citations

Fault Diagnosis, Engineering, Machine Learning +19

Automatic Test Pattern Generation for Interconnect Open Defects

Stefan Spinner, Ilia Polian, Piet Engelke et al. · Proceedings - IEEE VLSI Test Symposium/Proceedings of the ... IEEE VLSI Test Symposium · 2008 · 38 citations

Engineering, Test Data Generation, Software Engineering +19

Efficiently Performing Yield Enhancements by Identifying Dominant Physical Root Cause from Test Fail Data

Manish Sharma, Brady Benware, Ling Lei et al. · 2008 · 36 citations

Engineering, Industrial Engineering, Root Cause +24