Friedrich Hapke

Cell-Aware Test

Friedrich Hapke, W. Redemund, Andreas Glowatz et al. · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 2014 · 185 citations · Full text

Hardware Security, Electrical Engineering, Physical Design (Electronics) +14

X-masking during logic BIST and its impact on defect coverage

Yuyi Tang, Hans-Joachim Wunderlich, Piet Engelke et al. · IEEE Transactions on Very Large Scale Integration (VLSI) Systems · 2006 · 93 citations

Hardware Trojan, Engineering, Vlsi Design +19

On Acceleration of SAT-Based ATPG for Industrial Designs

Rolf Drechsler, Görschwin Fey, Andreas Glowatz et al. · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 2008 · 92 citations

Engineering, Electronic Design Automation, Conjunctive Normal Forms +16

Defect-oriented cell-aware ATPG and fault simulation for industrial cell libraries and designs

Friedrich Hapke, Rene Krenz-Baath, Andreas Glowatz et al. · 2009 · 87 citations

Engineering, Vlsi Design, Atpg Tools +21

Embedded multi-detect ATPG and Its Effect on the Detection of Unmodeled Defects

J. Geuzebroek, Erik Jan Marinissen, Ananta K. Majhi et al. · 2007 · 65 citations

Engineering, Measurement, Multi-detect Atpg +19