W. Redemund

Cell-Aware Test

Friedrich Hapke, W. Redemund, Andreas Glowatz et al. · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 2014 · 192 citations · Full text

Engineering, Computer Engineering, Electrical Engineering +17

Cell-aware Production test results from a 32-nm notebook processor

Friedrich Hapke, Michael Reese, J. Rivers et al. · 2012 · 65 citations

Engineering, Computer Engineering, Computer Systems +15

Defect-oriented cell-internal testing

Friedrich Hapke, W. Redemund, Juergen Schloeffel et al. · 2010 · 49 citations

Engineering, Computer Engineering, Electrical Engineering +10

Cell-aware analysis for small-delay effects and production test results from different fault models

Friedrich Hapke, Juergen Schloeffel, W. Redemund et al. · 2011 · 44 citations

Engineering, Computer Engineering, Electrical Engineering +17

DPPM Reduction Methods and New Defect Oriented Test Methods Applied to Advanced FinFET Technologies

W.D. Howell, Friedrich Hapke, Edward Brazil et al. · 2018 · 43 citations

Engineering, Computer Engineering, Electrical Engineering +10