Manish Sharma

Saying the wrong thing: improving learning with multimedia by including misconceptions

David A. Muller, James Bewes, Manish Sharma et al. · Journal of Computer Assisted Learning · 2007 · 145 citations

Education, Instruction, Science Education +17

A Rapid Yield Learning Flow Based on Production Integrated Layout-Aware Diagnosis

Martin Keim, N. Tamarapalli, Huaxing Tang et al. · Proceedings/Proceedings - International Test Conference · 2006 · 72 citations

Engineering, Manufacturing Engineering, Design Automation +13

</title> </titles> <publication_date> <month>02</month> <year>2012</year> </publication_date> <pages> <first_page>64</first_page> <last_page>64</last_page> </pages> <publisher_item> <item_number item_number_type='arNumber'>6198433</item_number> </publisher_item> <doi_data> <doi>10.1109/MDT.2012.2196611</doi> <resource>http://ieeexplore.ieee.org/lpdocs/epic03/wrapper.htm?arnumber=6198433</resource> </doi_data> </journal_article> <journal_article> <titles> <title><![CDATA[</title> </titles> <publication_date> <month>02</month> <year>2012</year> </publication_date> <pages> <first_page>72</first_page> <last_page>72</last_page> </pages> <publisher_item> <item_number item_number_type='arNumber'>6198434</item_number> </publisher_item> <doi_data> <doi>10.1109/MDT.2012.2196612</doi> <resource>http://ieeexplore.ieee.org/lpdocs/epic03/wrapper.htm?arnumber=6198434</resource> </doi_data> </journal_article> <journal_article> <titles> <title><![CDATA[</title> </titles> <publication_date> <month>02</month> <year>2012</year> </publication_date> <pages> <first_page>79</first_page> <last_page>79</last_page> </pages> <publisher_item> <item_number item_number_type='arNumber'>6198435</item_number> </publisher_item> <doi_data> <doi>10.1109/MDT.2012.2196613</doi> <resource>http://ieeexplore.ieee.org/lpdocs/epic03/wrapper.htm?arnumber=6198435</resource> </doi_data> </journal_article> <journal_article> <titles> <title><![CDATA[Determining a Failure Root Cause Distribution From a Population of Layout-Aware Scan Diagnosis Results

Brady Benware, Chris Schuermyer, Manish Sharma et al. · IEEE Design & Test of Computers · 2012 · 48 citations

Engineering, Electrical Engineering, Microelectronics +4

Signature Based Diagnosis for Logic BIST

Wu-Tung Cheng, Manish Sharma, Thomas Rinderknecht et al. · Proceedings/Proceedings - International Test Conference · 2006 · 43 citations

Engineering, Computer Engineering, Computer Science +15

Testing of critical paths for delay faults

Manish Sharma, J.H. Patel · 2002 · 38 citations

Engineering, Computer Engineering, Electrical Engineering +9