Proceedings/Proceedings - International Test Conference

Preferred Fill: A Scalable Method to Reduce Capture Power for Scan Based Designs

Santiago Remersaro, Xijiang Lin, Zhuo Zhang et al. · 2006 · 239 citations

Engineering, Computer Engineering, Electrical Engineering +17

A Logic Diagnosis Methodology for Improved Localization and Extraction of Accurate Defect Behavior

Rao Desineni, Osei Poku, R.D. Blanton · 2006 · 107 citations

Engineering, Computer Science, Electrical Engineering +17

A Rapid Yield Learning Flow Based on Production Integrated Layout-Aware Diagnosis

Martin Keim, N. Tamarapalli, Huaxing Tang et al. · 2006 · 72 citations

Engineering, Manufacturing Engineering, Design Automation +13

Dependable Network-on-Chip Router Able to Simultaneously Tolerate Soft Errors and Crosstalk

Arthur Pereira Frantz, Fernanda Lima Kastensmidt, Luigi Carro et al. · 2006 · 54 citations

Engineering, Computer Engineering, Computer Systems +17

At-Speed Structural Test For High-Performance ASICs

Vikram Iyengar, Toshihiko Yokota, Kazuhiro YAMADA et al. · 2006 · 53 citations

Engineering, Computer Engineering, Electrical Engineering +16