R.D. Blanton - Concepedia

Author

R.D. Blanton

Also Known As

Blanton, R. D., R D Blanton, R. Blanton, R. D. (Shawn) Blanton, R. D. Blanton, R. D. S. Blanton, R. D. Shawn Blanton, R.D. (Shawn) Blanton, R.D. Blanton, R.D. Shawn Blanton

162

Publications

2.4K

Citations

H-Index

140

Concepts

All Affiliations

Carnegie Mellon University

About

R.D. Blanton is an author at Carnegie Mellon University specializing in engineering, computer engineering, and software testing.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	30	68	2K
2	Education	8	8	284
3	Business	1	1	39
4	Health Sciences	1	1	37
5	Management	1	1	49

R.D. Blanton

Publications

2.1K

Citations

H-Index

Page 1

	Year	Citations
A Logic Diagnosis Methodology for Improved Localization and Extraction of Accurate Defect Behavior Rao Desineni, Osei Poku, R.D. Blanton Proceedings/Proceedings - International Test Conference Fault DiagnosisEngineeringVerificationDiagnosisFailing Ic	2006	107
Virtual Probe: A Statistical Framework for Low-Cost Silicon Characterization of Nanoscale Integrated Circuits Wangyang Zhang, Xin Li, Frank Liu, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems EngineeringVlsi DesignMeasurementEducationIntegrated Circuits	2011	70
Properties of the input pattern fault model R.D. Blanton, John P. Hayes EngineeringHardware Verification LanguageVerificationComputer ArchitectureIc Failure Analysis	2002	65
Analysis of failure sources in surface-micromachined MEMS Nabamita Deb, R.D. Blanton EngineeringMechanical EngineeringMicroactuatorMicro-electromechanical SystemReliability Engineering	2002	55
Analyzing the effectiveness of multiple-detect test sets R.D. Blanton, K.N. Dwarakanath, Aekta Shah EngineeringVerificationDiagnosisSoftware AnalysisDefect Excitation	2004	55
Virtual probe Xin Li, Rob R. Rutenbar, R.D. Blanton New TechniqueWafer Scale ProcessingEngineeringVlsi DesignCompressed Sensing	2009	53
Universal fault simulation using fault tuples K.N. Dwarakanath, R.D. Blanton EngineeringFault TupleComputer ArchitectureSimulationFormal Verification	2000	50
Test-data volume optimization for diagnosis Hongfei Wang, Osei Poku, Xiaochun Yu, EngineeringMachine LearningIntelligent DiagnosticsMem TestingDiagnosis	2012	49
Statistical Test Compaction Using Binary Decision Trees Sounil Biswas, R.D. Blanton IEEE Design & Test of Computers EngineeringData MiningAutomated ReasoningDecision TreeSoftware Testing	2006	49
CAEN-BIST: testing the nanofabric J.G. Brown, R.D. Blanton EngineeringChemically-assembled Electronic NanotechnologyDefect ToleranceRegular ArchitecturesNanoelectronics	2005	46

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