R.D. Blanton

A Logic Diagnosis Methodology for Improved Localization and Extraction of Accurate Defect Behavior

Rao Desineni, Osei Poku, R.D. Blanton · Proceedings/Proceedings - International Test Conference · 2006 · 107 citations

Fault Diagnosis, Engineering, Verification +21

Virtual Probe: A Statistical Framework for Low-Cost Silicon Characterization of Nanoscale Integrated Circuits

Wangyang Zhang, Xin Li, Frank Liu et al. · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 2011 · 70 citations

Engineering, Vlsi Design, Measurement +27

Properties of the input pattern fault model

R.D. Blanton, John P. Hayes · 2002 · 65 citations

Engineering, Hardware Verification Language, Verification +19

Analysis of failure sources in surface-micromachined MEMS

Nabamita Deb, R.D. Blanton · 2002 · 55 citations

Engineering, Mechanical Engineering, Microactuator +16

Analyzing the effectiveness of multiple-detect test sets

R.D. Blanton, K.N. Dwarakanath, Aekta Shah · 2004 · 55 citations

Engineering, Verification, Diagnosis +17