Santiago Remersaro

Preferred Fill: A Scalable Method to Reduce Capture Power for Scan Based Designs

Santiago Remersaro, Xijiang Lin, Zhuo Zhang et al. · Proceedings/Proceedings - International Test Conference · 2006 · 236 citations

Engineering, Electronic Design Automation, Computer Architecture +23

Low Shift and Capture Power Scan Tests

Santiago Remersaro, Xijiang Lin, S.M. Reddy et al. · 2007 · 53 citations

Engineering, Measurement, Mem Testing +18

ATPG Heuristics Dependant Observation Point Insertion for Enhanced Compaction and Data Volume Reduction

Santiago Remersaro, J. Rajski, Thomas Rinderknecht et al. · 2008 · 26 citations

Engineering, Observation Points, Mem Testing +16

Scan-Based Tests with Low Switching Activity

Santiago Remersaro, Xijiang Lin, S.M. Reddy et al. · IEEE Design & Test of Computers · 2007 · 22 citations

Electrical Engineering, Engineering, System Testing +15

A scalable method for the generation of small test sets

Santiago Remersaro, J. Rajski, S.M. Reddy et al. · Design, Automation, and Test in Europe · 2009 · 12 citations

Engineering, Verification, Computer Architecture +23