Built-in Self-test

Built-In Self-Test is a design-for-testability technique in System-On-Chip and VLSI design that integrates dedicated on-chip hardware to autonomously perform testing of integrated circuits, distinguishing itself by enabling in-situ fault detection without external test equipment.

5.1K

Publications

195.7K

Citations

8.5K

Authors

1.4K

Institutions

Publications per year

2017–2026

380

Variants

Bist

Parents

System-on-chip DesignVlsi Design

Children

Analog Built-in Self-testAt-speed TestingBoundary Scan TestingBridging Fault TestingBuilt-in Current TestingBuilt-in Self-diagnosisBuilt-in Self-repairConcurrent Self-testDelay Fault TestingDeterministic Test Pattern Generation

Publications

5.1K

Combinational profiles of sequential benchmark circuits

F. Brglez, D. Bryan, Krzysztof Koźmiński · 2003 · 2.1K citations

Engineering, Computer Engineering, Computer Science +17

Digital Systems : Testing and Testable Design

European Journal of Operational Research · 1990 · 1.5K citations

Engineering, Computer Engineering, Systems Engineering +14

Fault injection techniques and tools

Mei-Chen Hsueh, Timothy Tsai, Ravishankar K. Iyer · Computer · 1997 · 869 citations · Full text

Engineering, Computer Engineering, Computer Systems +14

Built-in test for VLSI: Pseudorandom techniques

Integration · 1989 · 866 citations

Engineering, Computer Engineering, Electrical Engineering +12

A logic design structure for LSI testability

E. B. Eichelberger, T.W. Williams · Design Automation Conference · 1977 · 837 citations

Engineering, Computer Engineering, Computer Systems +14

1–5 of 5.1K

Authors

8.5K

SR
S.M. Reddy
University of Iowa, United States
115 publications · 5.4K citations
41
h-index
KC
Krishnendu Chakrabarty
Duke University, United States
133 publications · 5.1K citations
39
h-index
EJ
Erik Jan Marinissen
IMEC, Belgium
56 publications · 3.6K citations
33
h-index
YZ
Y. Zorian
Cirrus Logic (United States), United States
73 publications · 4.1K citations
33
h-index
IP
Irith Pomeranz
University of Iowa, United States
93 publications · 3.9K citations
32
h-index

1–5 of 8.5K

Institutions

1.4K

1–8 of 1.4K

Venues

IEEE Transactions on Computers
199 publications · 13.8K citations
63
h-index
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
298 publications · 14.5K citations
62
h-index
IEEE Design & Test of Computers
155 publications · 8.8K citations
51
h-index
IEEE Transactions on Nuclear Science
112 publications · 4.7K citations
38
h-index
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
134 publications · 4.5K citations
37
h-index

1–5